发明名称 Method of manufacturing a drain side gate trench metal-oxide-semiconductor field effect transistor
摘要 Embodiments of the present invention provide a striped or closed cell trench metal-oxide-semiconductor field effect transistor (TMOSFET). The striped or closed cell TMOSFET comprises a source region, a body region disposed above the source region, a drift region disposed above the body region, a drain region disposed above the drift region. A gate region is disposed above the source region and adjacent the body region. A gate insulator region electrically isolates the gate region from the source region, body region, drift region and drain region. The body region is electrically coupled to the source region.
申请公布号 US7344945(B1) 申请公布日期 2008.03.18
申请号 US20040023327 申请日期 2004.12.22
申请人 VISHAY-SILICONIX 发明人 PATTANAYAK DEVA;QI JASON (JIANHAI);BAI YUMING;LUI KAM-HONG;WONG RONALD
分类号 H01L21/336;H01L29/40;H01L29/76;H01L29/78;H01L29/94;H01L31/062;H01L31/113;H01L31/119 主分类号 H01L21/336
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