发明名称 |
POSITIVE TYPE PHOTORESIST COMPOSITION |
摘要 |
PROBLEM TO BE SOLVED: To provide a positive type photoresist composition for exposure with far UV having high resolving power, good fitness for a halftone phase shift mask (side lobe light resistance) and lowered density dependency. SOLUTION: The positive type photoresist composition contains (A) a compound which generates an acid when irradiated with active light or radiation, (B) two polymers each having specified repeating units each having a group which is decomposed by the action of the acid and (C) an acid diffusion inhibitor. |
申请公布号 |
JP2002303981(A) |
申请公布日期 |
2002.10.18 |
申请号 |
JP20010108727 |
申请日期 |
2001.04.06 |
申请人 |
FUJI PHOTO FILM CO LTD |
发明人 |
UENISHI KAZUYA;SATO KENICHIRO;AOSO TOSHIAKI |
分类号 |
G03F7/039;C08F220/10;C08F222/06;C08F232/08;H01L21/027 |
主分类号 |
G03F7/039 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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