发明名称 POSITIVE TYPE PHOTORESIST COMPOSITION
摘要 PROBLEM TO BE SOLVED: To provide a positive type photoresist composition for exposure with far UV having high resolving power, good fitness for a halftone phase shift mask (side lobe light resistance) and lowered density dependency. SOLUTION: The positive type photoresist composition contains (A) a compound which generates an acid when irradiated with active light or radiation, (B) two polymers each having specified repeating units each having a group which is decomposed by the action of the acid and (C) an acid diffusion inhibitor.
申请公布号 JP2002303981(A) 申请公布日期 2002.10.18
申请号 JP20010108727 申请日期 2001.04.06
申请人 FUJI PHOTO FILM CO LTD 发明人 UENISHI KAZUYA;SATO KENICHIRO;AOSO TOSHIAKI
分类号 G03F7/039;C08F220/10;C08F222/06;C08F232/08;H01L21/027 主分类号 G03F7/039
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