发明名称 |
Substrate treatment method and substrate treatment apparatus |
摘要 |
The inventive substrate treatment apparatus includes a spin chuck which horizontally holds and rotates a wafer; a heater which is disposed in opposed relation to a lower surface of the wafer held by the spin chuck and heats the wafer from a lower side; a phosphoric acid nozzle which spouts a phosphoric acid aqueous solution to a front surface (upper surface) of the wafer held by the spin chuck; and a suspension liquid nozzle which spouts a silicon suspension liquid to the front surface of the wafer held by the spin chuck. The wafer is maintained at a higher temperature on the order of 300° C. and, in this state, a liquid mixture of the phosphoric acid aqueous solution and the silicon suspension liquid is supplied to the front surface of the wafer. |
申请公布号 |
US9364873(B2) |
申请公布日期 |
2016.06.14 |
申请号 |
US201314039695 |
申请日期 |
2013.09.27 |
申请人 |
SCREEN HOLDINGS CO., LTD. |
发明人 |
Hinode Taiki;Hashizume Akio;Ota Takashi |
分类号 |
H01L21/306;H01L21/311;C09K13/04;C09K5/14;B08B7/00;H01L21/4757;C11D3/37;C11D7/08;C11D11/00;H01L21/67;H01L21/687 |
主分类号 |
H01L21/306 |
代理机构 |
McDermott Will & Emery LLP |
代理人 |
McDermott Will & Emery LLP |
主权项 |
1. A substrate treatment method comprising:
a higher temperature maintaining step of maintaining a substrate held by a substrate holding unit at a higher temperature that is not lower than 250° C.; and a phosphoric acid/suspension liquid supplying step of supplying a phosphoric acid aqueous solution and a silicon suspension liquid to a front surface of the substrate held by the substrate holding unit. |
地址 |
Kyoto JP |