发明名称 Substrate treatment method and substrate treatment apparatus
摘要 The inventive substrate treatment apparatus includes a spin chuck which horizontally holds and rotates a wafer; a heater which is disposed in opposed relation to a lower surface of the wafer held by the spin chuck and heats the wafer from a lower side; a phosphoric acid nozzle which spouts a phosphoric acid aqueous solution to a front surface (upper surface) of the wafer held by the spin chuck; and a suspension liquid nozzle which spouts a silicon suspension liquid to the front surface of the wafer held by the spin chuck. The wafer is maintained at a higher temperature on the order of 300° C. and, in this state, a liquid mixture of the phosphoric acid aqueous solution and the silicon suspension liquid is supplied to the front surface of the wafer.
申请公布号 US9364873(B2) 申请公布日期 2016.06.14
申请号 US201314039695 申请日期 2013.09.27
申请人 SCREEN HOLDINGS CO., LTD. 发明人 Hinode Taiki;Hashizume Akio;Ota Takashi
分类号 H01L21/306;H01L21/311;C09K13/04;C09K5/14;B08B7/00;H01L21/4757;C11D3/37;C11D7/08;C11D11/00;H01L21/67;H01L21/687 主分类号 H01L21/306
代理机构 McDermott Will & Emery LLP 代理人 McDermott Will & Emery LLP
主权项 1. A substrate treatment method comprising: a higher temperature maintaining step of maintaining a substrate held by a substrate holding unit at a higher temperature that is not lower than 250° C.; and a phosphoric acid/suspension liquid supplying step of supplying a phosphoric acid aqueous solution and a silicon suspension liquid to a front surface of the substrate held by the substrate holding unit.
地址 Kyoto JP