发明名称 FILM DEPOSITION METHOD
摘要 PROBLEM TO BE SOLVED: To form a nitride film having a prescribed thickness on a base film, while suppressing reduction of a thickness of the base film containing carbon atoms.SOLUTION: A film deposition method for forming a nitride film on a substrate placed in a treatment vessel of a film deposition apparatus, and having a carbon-containing film containing carbon atoms includes a protection film formation process for forming a protection film on the carbon-containing film by plasma of first reaction gas including gas of nitride species not containing hydrogen atoms and inert gas.SELECTED DRAWING: Figure 14
申请公布号 JP2016121368(A) 申请公布日期 2016.07.07
申请号 JP20140259976 申请日期 2014.12.24
申请人 TOKYO ELECTRON LTD 发明人 OYAMA TAKESHI;FUKIAGE NORIAKI
分类号 C23C16/511;C23C16/42;C23C16/455;H01L21/31;H01L21/318 主分类号 C23C16/511
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