发明名称 SENSOR SYSTEM AND METHOD FOR CHARACTERIZING A STACK OF WET PAINT LAYERS
摘要 A method of characterizing a wet paint layer stack of a painted body is provided, which comprises at least two wet paint layers, by individual parameters of the wet paint layers, based on fitting to a physical model, the method being carried out by a sensor system in a non-contact manner The sensor system comprises an emitter system for emitting THz radiation, a detector system for detecting THz radiation, and a processing unit operationally coupled to the emitter system and the detector system. The method comprises: Emitting, by the emitter system, a THz radiation signal towards the painted body such that the THz radiation interacts with the wet paint layer stack,detecting, by the detector system, a response signal being the detected THz radiation signal having interacted with the wet paint layer stack;Determining model parameters of the physical model by optimizing the model parameters such that a predicted response signal of the physical model, which approximates the interaction of the THz radiation signal with the wet paint layer stack, is fitted to the detected response signal, wherein at least some of the model parameters are indicative of individual optical properties of the wet paint layers and of a wet paint layer thickness; and Determining, from the determined model parameters, the individual paint layer parameters of at least one of the wet paint layers.
申请公布号 WO2016138935(A1) 申请公布日期 2016.09.09
申请号 WO2015EP54352 申请日期 2015.03.03
申请人 ABB TECHNOLOGY LTD 发明人 VAN MECHELEN, Jacobus Lodevicus Martinus
分类号 G01B11/06;G01N21/3581;G01N21/84;G01N33/32 主分类号 G01B11/06
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