发明名称 METHOD AND DEVICE FOR DETECTING ABNORMAL STATE
摘要 PROBLEM TO BE SOLVED: To provide a method and a device for detecting an abnormal state.SOLUTION: A method of detecting an abnormal state according to an embodiment of the present invention includes the steps of: detecting whether a first object is present in an acquired image; when the first object is present in the image, recognizing whether the first object carries a material; when the first object carries a material, acquires information on a motion of the material; and determines whether the state is abnormal on the basis of the information of a motion of the material.SELECTED DRAWING: Figure 1
申请公布号 JP2016167267(A) 申请公布日期 2016.09.15
申请号 JP20160043430 申请日期 2016.03.07
申请人 RICOH CO LTD 发明人 XIONG YING FANG;CHENG ZHONGWEI;SHIN WOO WANG;WANG QIAN;QIAO GANG
分类号 G06T7/20;G06T7/60;G08B25/00;G08B25/04 主分类号 G06T7/20
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