发明名称 Element and apparatus for attenuated total reflection measurement, and method for measuring specific component using the same
摘要 <p>An improved attenuated total reflection (ATR) element and the measurement apparatus employing the element capable of performing a measurement with a high accuracy at a low operating cost is disclosed. An ATR element of the present invention permits an incident beam to have an internal total reflection at the surface, and comprises a projection protruded at the portion where the incident beam has the internal total reflection. <IMAGE> <IMAGE></p>
申请公布号 EP0899557(A2) 申请公布日期 1999.03.03
申请号 EP19980306756 申请日期 1998.08.24
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 UCHIDA, SHINJI;ATSUTA, HIROSHI
分类号 G01N21/27;G01N21/552;(IPC1-7):G01N21/55 主分类号 G01N21/27
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