发明名称 |
Element and apparatus for attenuated total reflection measurement, and method for measuring specific component using the same |
摘要 |
<p>An improved attenuated total reflection (ATR) element and the measurement apparatus employing the element capable of performing a measurement with a high accuracy at a low operating cost is disclosed. An ATR element of the present invention permits an incident beam to have an internal total reflection at the surface, and comprises a projection protruded at the portion where the incident beam has the internal total reflection. <IMAGE> <IMAGE></p> |
申请公布号 |
EP0899557(A2) |
申请公布日期 |
1999.03.03 |
申请号 |
EP19980306756 |
申请日期 |
1998.08.24 |
申请人 |
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. |
发明人 |
UCHIDA, SHINJI;ATSUTA, HIROSHI |
分类号 |
G01N21/27;G01N21/552;(IPC1-7):G01N21/55 |
主分类号 |
G01N21/27 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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