发明名称 Semiconductor exposure apparatus and method of driving the same
摘要 A semiconductor exposure apparatus includes a light exposure portion irradiating light on a semiconductor wafer through a reticle; a pellicle particle detector detecting a particle existing on a surface of the reticle; a particle cleaner cleaning the reticle when the particle exists on the surface of the reticle; a robot arm moving the reticle to a desired location in response to a control signal generated from a main controller; and the main controller controlling an operation of the semiconductor exposure apparatus.
申请公布号 US2002176060(A1) 申请公布日期 2002.11.28
申请号 US20020147581 申请日期 2002.05.17
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK SOON-JONG
分类号 H01L21/027;G03F1/00;G03F7/20;(IPC1-7):G03B27/42 主分类号 H01L21/027
代理机构 代理人
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