发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device which reduces influence on the transistor threshold variation, which is one among noise components in the amplification of a sense amplifier, thereby enabling the sense amplifier to exact ly sense/amplify microsignals read from memory cells. SOLUTION: In a DRAM chip Chip, sense amplifier cross coupling parts CC use p<+> gate PMOS parts Qp0, Qp1 of a p<+> polysilicon gate, having low impurity concentration in a channel and n<+> gate NMOS parts Qn0, Qn1 of an n<+> polysilicon gate, and the PMOS has a high substrate voltage and the NMOS has a low substrate voltage. This reduces the threshold variation due to channel implantation, thereby making a sense amplifier exactly sense/amplify micro-signals generated on data lines, during reading out of a low-voltage memory array. The substrate bias effect raises the threshold and lessens the leakage current in a sense amplifier data holding state.
申请公布号 JP2002261254(A) 申请公布日期 2002.09.13
申请号 JP20010056463 申请日期 2001.03.01
申请人 HITACHI LTD;NEC CORP 发明人 TAKEMURA RIICHIRO;TAKAHASHI TSUGIO;NAKAMURA MASAYUKI;NAGAI AKIRA;TAKAURA NORIKATSU;SEKIGUCHI TOMONORI;KIMURA SHINICHIRO
分类号 G11C11/409;G11C7/06;G11C11/4091;H01L21/8238;H01L21/8242;H01L27/092;H01L27/108;(IPC1-7):H01L27/108;H01L21/824 主分类号 G11C11/409
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