发明名称 NONVOLATILE SEMICONDUCTOR MEMORY DEVICE HAVING CONSTANT BIT LINE PRECHARGE LEVEL BY COMPENSATING THE CHANGES OF THE BIT LINE PRECHARGE LEVEL DUE TO THE TEMPERATURE CHANGES
摘要 PURPOSE: A nonvolatile semiconductor memory device having constant bit line precharge level is provided to reduce the reading error by compensating the changes of the bit line precharge level due to the temperature changes. CONSTITUTION: A nonvolatile semiconductor memory device comprises an electrically programmable memory cell array(100) connected with plural word lines(WL) and plural bitlines(BL); a bit line power supply circuit(400) for supplying bit line voltages to the plural bitlines; a shut off circuit(200) connected between the memory cell array and the bit line power supply circuit, for electrically connecting or disconnecting the memory cell array to/from the bit line power supply circuit; a shut off control circuit(300) for controlling the shut off circuit(200). Wherein, the shut off circuit(200) consists of NMOS transistors of which a gate is connected to the shut off control circuit(300), a drain is connected to the bit line power supply circuit(400) and a source is connected to the bit line, and the shut off control circuit(300) compensates the changes of the bit line precharge level due to the temperature changes by controlling the gate voltage(BLSHF) of a shut off transistor(T100).
申请公布号 KR20050017475(A) 申请公布日期 2005.02.22
申请号 KR20030056164 申请日期 2003.08.13
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, KYEONG HAN;LEE, SUNG SOO
分类号 G11C16/06;G11C11/34;G11C16/02;G11C16/04;G11C16/24;G11C16/26;(IPC1-7):G11C16/24 主分类号 G11C16/06
代理机构 代理人
主权项
地址