METHOD FOR DETECTING DEFECTS OF A CHIP

摘要

A method for detecting a defect of a chip includes: utilizing a plurality of scan patterns to scan a plurality of scan chains of the chip; for each of the scan patterns, obtaining a suspected defect set and an unsuspected defect set; obtaining an intersection of all suspected defect sets corresponding to the scan patterns; obtaining an union of all unsuspected defect sets corresponding to the scan patterns; subtracting the union from the intersection to obtain a resultant suspected defect set; and detecting the defect of the chip according to the resultant suspected defect set.