发明名称 Method of fabricating single-crystal silicon film and method of fabricating TFT adopting the same
摘要 A method for forming a single-crystal silicon film of high quality is provided. The method includes the operations of: growing single-crystal silicon to a predetermined thickness of a crystal growth plate; depositing a buffer layer on the single-crystal silicon layer; forming a partition layer at a predetermined depth in the single-crystal silicon layer by implanting hydrogen ions in the single-crystal silicon layer from an upper portion of an insulating layer; attaching a substrate onto the buffer layer; and cutting the partition layer of the single-crystal silicon layer by heating the partition layer from the crystal growth plate to obtain a single-crystal silicon layer of a predetermined thickness on the substrate.
申请公布号 US7402465(B2) 申请公布日期 2008.07.22
申请号 US20050270607 申请日期 2005.11.10
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 NOGUCHI TAKASHI;XIANYU WENXU
分类号 H01L21/00 主分类号 H01L21/00
代理机构 代理人
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