PARAMETRIC SCAN REGISTER, DIGITAL CIRCUIT AND METHOD FOR TESTING A DIGITAL CIRCUIT USING SUCH REGISTER,申请号EP20070820965-传众专利搜索

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发明名称	PARAMETRIC SCAN REGISTER, DIGITAL CIRCUIT AND METHOD FOR TESTING A DIGITAL CIRCUIT USING SUCH REGISTER
摘要
申请公布号	EP2069814(A1)	申请公布日期	2009.06.17
申请号	EP20070820965	申请日期	2007.10.05
申请人	COMMISSARIAT A L'ENERGIE ATOMIQUE	发明人	HERON, OLIVIER;BONHOMME, YANNICK
分类号	G01R31/3185;G01R31/30	主分类号	G01R31/3185
代理机构		代理人
主权项
地址

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