发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE
摘要 With a method for manufacturing a semiconductor device, a semiconductor layer having a protrusion on a main face is formed. The protrusion includes an upper face and side faces. A conductive layer on a region that includes at least the upper face and the side faces of the protrusion is formed. A first mask that partially covers a surface of the conductive layer is formed. A part of the conductive layer is etched by using the first mask in a first etching process. A second mask that at least partially covers the surface of the conductive layer that has undergone the first etching process is formed. A part of the conductive layer is etched by using the second mask to expose a part of the semiconductor layer and to form the conductive layer into an electrode in a second etching process.
申请公布号 US2016247682(A1) 申请公布日期 2016.08.25
申请号 US201615047774 申请日期 2016.02.19
申请人 NICHIA CORPORATION 发明人 HARADA Susumu
分类号 H01L21/283;H01L21/308;H01L29/423;H01L21/306 主分类号 H01L21/283
代理机构 代理人
主权项 1. A method for manufacturing a semiconductor device, comprising: forming a semiconductor layer having a protrusion on a main face, the protrusion having an upper face and side faces; forming a conductive layer on a region that includes at least the upper face and the side faces of the protrusion; forming a first mask that partially covers a surface of the conductive layer; etching a part of the conductive layer by using the first mask in a first etching process; forming a second mask that at least partially covers the surface of the conductive layer that has undergone the first etching process; and etching a part of the conductive layer by using the second mask to expose a part of the semiconductor layer and to form the conductive layer into an electrode in a second etching process.
地址 Anan-shi JP
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