| 摘要 |
<p>A deflection device having a longitudinal configuration is fixed at one of its ends to a base supporting structure and is responsive to a first electrical signal from a control network to move the other of its ends in a first direction. The arm assembly can include at least one piezoelectric crystal having characteristics for deflecting in response to the first signal and for oscillating in response to abrupt changes in the magnitude of the first signal. This deflection device is particularly adapted for use as a probe for testing electrical circuits having a plurality of contact points coated with an insulating material. A probe tip can be disposed in proximity to the second end of the device so that the deflection of the crystal provides the tip with kinetic energy for penetrating the insulating material to provide electrical contact with one of the contact points. A second signal can then be introduced to the probe tip to test the electrical circuit. A pair of piezoelectric crystals spaced by a conductive material can provide a capacitance in the control network for shaping the first signal to inhibit the oscillations of the crystals.</p> |
