发明名称 Selective substrate implant process for decoupling analog and digital grounds
摘要 An integrated circuit fabrication process includes a selective substrate implant process to effectively decouple a first power supply connection from a second power supply connection while providing immunity against parasitic effects. In one embodiment, the selective substrate implant process forms heavily doped p-type regions only under P-wells in which noise producing circuitry are built. The noisy ground connection for these P-wells are decoupled from the quiet ground connection for others P-wells not connected to any heavily doped regions and in which noise sensitive circuitry are built. The selective substrate implant process of the present invention has particular applications in forming CMOS analog integrated circuits where it is important to decouple the analog ground for sensitive analog circuitry from the often noisy digital grounds of the digital and power switching circuitry.
申请公布号 US6395591(B1) 申请公布日期 2002.05.28
申请号 US20000733543 申请日期 2000.12.07
申请人 MICREL, INCORPORATED 发明人 MCCORMACK STEPHEN;ALTER MARTIN;WRATHALL ROBERT S.;LABER CARLOS ALBERTO
分类号 H01L21/761;H01L21/8238;H01L27/092;(IPC1-7):H01L21/823 主分类号 H01L21/761
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