发明名称 |
METHOD FOR FABRICATING SPIN-ON-GLASS INSULATION LAYER OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for fabricating a spin-on-glass(SOG) insulation layer of a semiconductor device is provided to control generation of particles on a substrate in a high temperature annealing process when using a silazane-based SOG layer as an insulation layer by using poly silazane. CONSTITUTION: The SOG insulation layer is formed on a substrate having a plurality of stepped patterns by using a poly silazane solution whose solid component is not more than 20 weight percent(120). A pre-bake process is performed in a temperature scope from 50 to 350 deg.C to eliminate a solvent component of the SOG insulation layer(130). An annealing process is performed in a temperature scope from 600 to 1200 deg.C(150).
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申请公布号 |
KR100354441(B1) |
申请公布日期 |
2002.09.13 |
申请号 |
KR20000082829 |
申请日期 |
2000.12.27 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
GOO, JU SEON;HONG, EUNKEE;HONG, JIN GI;KIM, HONG GUN |
分类号 |
H01L21/312;H01L21/316;(IPC1-7):H01L21/316 |
主分类号 |
H01L21/312 |
代理机构 |
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地址 |
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