发明名称 |
Testing an electronic device using test data from a plurality of testers |
摘要 |
A method and apparatus for testing a set of electronic devices can comprise placing electronic devices into a test station. A plurality of testers can provide test data to the test station. The test station can test the electronic devices using test data received from the plurality of testers. One of the testers can communication with another of the testers regarding the testing of the electronic devices. Probes can be used to contact the electronic devices, and one of the electronic devices can be contacted by more than one of the probes.
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申请公布号 |
US7548055(B2) |
申请公布日期 |
2009.06.16 |
申请号 |
US20070696582 |
申请日期 |
2007.04.04 |
申请人 |
FORMFACTOR, INC. |
发明人 |
KHANDROS IGOR Y.;ELDRIDGE BENJAMIN N.;MILLER CHARLES A.;SPORCK A. NICHOLAS |
分类号 |
G01R31/28;G01R1/073;G01R31/02;G01R31/26 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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