发明名称 MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE AND MANUFACTURING APPARATUS FOR SEMICONDUCTOR DEVICE
摘要 A wafer is placed on a lower electrode disposed in a reaction chamber; process gas is introduced into the reaction chamber; a magnetic field is applied at a position spaced from a surface of the wafer to be processed; plasma is generated by applying a high-frequency voltage between the lower electrode and an upper electrode disposed to face the lower electrode; the magnetic field is removed after the plasma is stabilized; and the wafer is plasma-processed.
申请公布号 US2009156002(A1) 申请公布日期 2009.06.18
申请号 US20080331199 申请日期 2008.12.09
申请人 FUJITA KEIJI;KANEKO HISASHI 发明人 FUJITA KEIJI;KANEKO HISASHI
分类号 H01L21/443;C23C16/44 主分类号 H01L21/443
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