发明名称 |
DEVICE FOR DOPING IMPURITY, METHOD FOR DOPING IMPURITY, AND METHOD FOR MANUFACTURING SEMICONDUCTOR ELEMENT |
摘要 |
PROBLEM TO BE SOLVED: To provide a device for doping impurities, a method for doping impurities, and a method for manufacturing a semiconductor element, in which impurity elements can be doped into an inside of an object that is made of a solid material at a higher concentration than concentrations conventionally obtained.SOLUTION: An impurity doping apparatus 1a includes: a beam adjusting system 33 having a light source 34 that emits a light pulse, and irradiating an object 2 with the light pulse; and a light source control unit 32 for controlling the light source 34. An impurity source film 4 is formed on a surface of the object 2 that is made of a solid material, the impurity source film containing impurity elements and having a film thickness determined in consideration of an irradiation time per light pulse and the energy density of the light pulse, and the impurity source film 4 is irradiated with the light pulse with the irradiation time and the energy density so as to dope the impurity elements into the object.SELECTED DRAWING: Figure 1 |
申请公布号 |
JP2016157911(A) |
申请公布日期 |
2016.09.01 |
申请号 |
JP20150169698 |
申请日期 |
2015.08.28 |
申请人 |
KYUSHU UNIV;FUJI ELECTRIC CO LTD |
发明人 |
IKEDA AKIHIRO;IKEGAMI HIROSHI;ASANO TANEMASA;IGUCHI KENICHI;NAKAZAWA HARUO;SEKI YASUKAZU |
分类号 |
H01L21/22;H01L21/329;H01L21/336;H01L29/12;H01L29/47;H01L29/78;H01L29/861;H01L29/868;H01L29/872 |
主分类号 |
H01L21/22 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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