| 摘要 |
PCT No. PCT/JP87/00434 Sec. 371 Date Jan. 13, 1988 Sec. 102(e) Date Jan. 13, 1988 PCT Filed Jun. 26, 1987 PCT Pub. No. WO87/01452 PCT Pub. Date Mar. 12, 1987.An apparatus for mass-analyzing ions that are generated by bombarding sample components supported by a target by a primary beam. The mass spectrum data thus obtained is preferably as correct as possible. To satisfy this requirement, mass number sweeping is started after the quantity of ions generated from the sample components becomes gets stabilized.
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