| 摘要 |
PROBLEM TO BE SOLVED: To provide an improved boundary scan system capable of scanning a device scan path in parallel. SOLUTION: In one embodiment of this improved boundary scan test system 200 capable of scanning the device scan path in parallel, a scan command obtained from a pattern file 245 is processed. The scan command is associated with test device data to be scanned inside the device of a type designated by a command from a PSUT device 100. As to the designated device type, a parallel device structure 300 is obtained. The parallel device structure includes one or more groups, and each of the groups identifies one or more parallel scan paths of the device inside the PSUT. To each of groups having a device of a device type, for which one or more scan paths are designated, a scan request including a scan image prepared for the group is produced. When the scan request is provided to a utility unit 210, the unit performs parallel scan of the scan image inside one or more scan paths of the group for scanning the test device data for the device of the designated device type in the group. |
