首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
MARKING METHOD OF WAFER
摘要
申请公布号
KR0160971(B1)
申请公布日期
1999.02.01
申请号
KR19900018349
申请日期
1990.11.13
申请人
LG SEMICONDUCTOR CO., LTD.
发明人
PARK, CHAN-YONG
分类号
H01L21/66;(IPC1-7):H01L21/66
主分类号
H01L21/66
代理机构
代理人
主权项
地址
您可能感兴趣的专利
REFRIGERATION SYSTEM WITH HEAT RECLAIM AND REMOTE CONDENSOR CONTROLLER
OFF-THE-ROAD TIRE TEMPERATURE AND PRESSURE MONITORING SYSTEM
PYRAZOLOPYRIMIDINES AND PYRAZOLOTRIAZINES
Myntlås
Anordning och användning vid två från och mot varandra arbetande delar och energiabsorberande anordning
QUAKE-SENSING APPARATUS
SURFACE PLATE CONTROL METHOD AND SURFACE PLATE CONTROL EQUIPMENT THEREOF, AND ALIGNER
SUBSTRATE HEATING DEVICE
DEVICE AND METHOD FOR DETERMINING POSITIONAL INFORMATION OF BAR CODE SCANNER
OPERATION RECORDING DEVICE
TORQUE SENSOR
PRESSURE SENSITIVE ADHESIVE SHEET
MANUFACTURE OF MULTILAYER CERAMIC CAPACITOR AND METALLIC VIA
ELECTROMAGNETIC WAVE GENERATING COMPOSITE
PHOTOGRAPHIC SENSITIVE MATERIAL PACKING PRESSURE SENSITIVE ADHESIVE SHEET AND PRESSURE SENSITIVE ADHESIVE
HORIZONTAL DEFLECTION CIRCUIT
INSULATING SUBSTRATE, SEMICONDUCTOR DEVICE AND SEMICONDUCTOR MOUNTING DEVICE
IMAGE FORMING DEVICE
DEVELOPING ROLLER AND DEVELOPING DEVICE
LASER EXPOSURE DEVICE