发明名称 MANUFACTURE OF SEMICONDUCTOR SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor substrate, wherein homogeneity of a porous silicon layer is improved, while manufacturing cost of a semiconductor element is lowered. SOLUTION: The manufacturing method is related to a semiconductor substrate for forming a large-area thin-film single-crystal silicon semiconductor element. Here, an adhesive layer comprises a polysilicon layer 12, and the surface of the polysilicon layer 12 is polished for bonding. To release a thin-film single-crystal silicon layer 13 from a single-crystal silicon substrate 14, a porous silicon layer 2 for releasing is formed on the single-crystal silicon substrate 14, and on the porous silicon layer 2, the thin-film single-crystal silicon layer 13 is epitaxially grown. A porous silicon layer 2 is formed by anode formation. In a transfer of the thin-film single-crystal silicon layer 13 to a support substrate 11, after the support substrate 11 and the single-crystal silicon substrate 14 have been pasted together at a low temperature, a shearing stress is applied due to the difference in thermal expansion coefficients between the support substrate 11 and the single-crystal silicon substrate 14 at a temperature rise or annealing at a high temperature to cause peeling off and transfer.
申请公布号 JPH1131828(A) 申请公布日期 1999.02.02
申请号 JP19970186653 申请日期 1997.07.11
申请人 SONY CORP 发明人 MATSUSHITA TAKESHI
分类号 H01L21/205;H01L21/02;H01L27/12;H01L31/04 主分类号 H01L21/205
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