发明名称 Semiconductor device testing carrier and method of fixing semiconductor device to testing carrier
摘要 A testing carrier has a flexible material such as a thin film employed as a supporting body which covers and thrusts a semiconductor device against a substrate. The substrate includes a plurality of contact terminals and a plurality of testing wiring patterns.
申请公布号 US5986459(A) 申请公布日期 1999.11.16
申请号 US19970889217 申请日期 1997.07.08
申请人 FUJITSU LIMITED 发明人 FUKAYA, FUTOSHI;MARUYAMA, SHIGEYUKI
分类号 G01R1/04;G01R31/28;(IPC1-7):G01R31/26 主分类号 G01R1/04
代理机构 代理人
主权项
地址