发明名称 |
Semiconductor device testing carrier and method of fixing semiconductor device to testing carrier |
摘要 |
A testing carrier has a flexible material such as a thin film employed as a supporting body which covers and thrusts a semiconductor device against a substrate. The substrate includes a plurality of contact terminals and a plurality of testing wiring patterns.
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申请公布号 |
US5986459(A) |
申请公布日期 |
1999.11.16 |
申请号 |
US19970889217 |
申请日期 |
1997.07.08 |
申请人 |
FUJITSU LIMITED |
发明人 |
FUKAYA, FUTOSHI;MARUYAMA, SHIGEYUKI |
分类号 |
G01R1/04;G01R31/28;(IPC1-7):G01R31/26 |
主分类号 |
G01R1/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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