| 摘要 |
PURPOSE: A method and an apparatus for compensating the brightness of a field emission device are provided to offer a uniform brightness using a special compensation circuit as measuring/remembering a beam current(voltage) of each scanning electrode, comparing the beam current(voltage) with each scanning electrode and making a feedback the difference. CONSTITUTION: The apparatus, in which cells are arrayed in a matrix type, combines an upper material on which a fluorescent material is coated and a lower material on which a cathode ray emitting device, with a predetermined distance apart. The electron emitted from cathode ray tube at the lower material is collided with the fluorescent material coated on the upper material when a voltage is applied between the upper and the lower materials. And The cell is arranged in matrix type to radiate the fluorescent material. The driver drives a scanning electrode applying a driving voltage of the first polarity, a signal electrode applying a voltage of the second polarity to the upper material and each of electrodes. The apparatus includes a test signal generating portion(100), a scanning electrode conduction current detecting portion(200), a compensation data generating portion(300) and a scanning electrode driving voltage setting portion(400). The test signal generating portion generates a picture information for testing and information about a driving voltage to drive a signal and each scanning line according to a horizontal/vertical synchronization to a scanning line driver(10) and a signal line driver(20). The scanning electrode conduction current detecting portion detects and remembers a degree of a conductive current applying to each scanning line in the scanning line driver when the scanning line driver and the signal line driver are driven according to a signal generated from the test signal generating portion. The compensation data generating portion receives the size of a voltage applied to each scanning electrode which is detected by the scanning electrode conductive current detecting portion and judges the intensity of an electron emitting beam and then calculates the mean value, the maximum value and the minimum value and generates a compensating voltage in each scanning electrode according to the result of the calculation and feedbacks the generated compensating voltage to the test signal generating portion. The scanning electrode driving voltage setting portion receives a data generated in the compensation data generating portion and sets a driving voltage by each of scanning electrodes consisting a tested FED panel at present.
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