| 摘要 |
PROBLEM TO BE SOLVED: To overcome such a problem that it is difficult to efficiently enhance the inspection accuracy of respective parts if the manufacturing bases of electronic parts are extended to many parts of the world. SOLUTION: In this visual inspection support system, the accuracies of inspection data are mutually referred to between a plurality of visual inspection devices 10. A test unit 14 scans the part on a substrate 1 to acquire an image, and a main unit 12 controls the test unit 14 to analyze the image. An inspection data holding unit 48 has inspection data, an evaluation unit 51 evaluates the accuracy of the inspection data, and a result data holding unit 49 has result data showing inspection accuracy. An offer processing unit 55 sends the result data and the inspection data to other device, and an acquisition processing unit 53 acquires inspection data of higher accuracy from the other device to renew the same. |
