发明名称 ELEMENT ANALYZING METHOD AND CHARACTERISTICS ANALYZING PROGRAM
摘要 <p>PROBLEM TO BE SOLVED: To expand the practical use of an analyzer by eliminating the error caused by the characteristics of the analyzer to analyze an element with high accuracy and simplifying analyzing work to achieve the effective utilization of human resources necessary for analysis. SOLUTION: A local analyzing center 2 prepares a sample from an object to be analyzed, and the analysis of an element is performed by the analyzer 4. The analyzer 4 irradiates the sample with ion beam to generate characteristic X-rays having energy intrinsic to the element contained in the sample, detects the characteristic X-rays by an X-ray detector to take the data due to the X-ray spectrum of the characteristic X-rays, and sends the data to a central analyzing center 1 through a network 3. The central analyzing center 1 calibrates the data according to a characteristics analyzing program on the basis of the characteristic element of the analyzer found out from the comparison with the data related to the check sample, of which the component element is known due to the analyzer 4 of the analyzing center 2 to send the analytical result to the analyzing center 2 through the network 3.</p>
申请公布号 JP2002277415(A) 申请公布日期 2002.09.25
申请号 JP20010075609 申请日期 2001.03.16
申请人 ION KASOKUKI KK 发明人 SASAKI HIROSHI;SASAKI TARO
分类号 G01N23/225;(IPC1-7):G01N23/225 主分类号 G01N23/225
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