发明名称 RETICLE, METHOD OF MANUFACTURING RETICLE, ALIGNER AND METHOD OF EXPOSURE
摘要 <p>PROBLEM TO BE SOLVED: To provide a reticle in which internal stresses in an absorber film are reduced, a method of manufacturing the same, and an aligner and a method of exposure using the reticle. SOLUTION: This reticle 10 comprises a multilayer film 12 for an X-ray reflector formed on a substrate 8, and an absorber film 14 formed on the multilayer film 12, wherein the absorber film 14, having a prescribed pattern, is composed of a substance having a large imaginary part in the complex index of refraction at the use wavelength region of the X-ray. The surface of the absorber film 14 has been irradiated with an Ar ion beam.</p>
申请公布号 JP2002329649(A) 申请公布日期 2002.11.15
申请号 JP20010132135 申请日期 2001.04.27
申请人 NIKON CORP 发明人 SHIRAISHI MASAYUKI
分类号 G03F1/22;G03F1/24;H01L21/027;(IPC1-7):H01L21/027;G03F1/16 主分类号 G03F1/22
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