发明名称 PIXEL OF CMOS IMAGE SENSOR AND METHOD FOR FORMING THE PIXEL STRUCTURE OF CMOS IMAGE SENSOR
摘要 A pixel of CMOS image sensor and a method for manufacturing the same are provided to lower height, to improve output signal efficiency and color sensitivity by forming a color filter within a photodiode. A pixel of CMOS image sensor includes a semiconductor substrate(401), a photodiode having a trench structure formed on an upper surface of the semiconductor substrate, and a color filter(411) formed in the inside of the trench. The color filter is formed by gap-filling a material for receiving selectively a particular wavelength band into the trench structure. The color filter is used for absorbing selectively one of R, G, and B colors. The pixel further includes an isolation layer(511) which is formed at one side of the photodiode and is formed perpendicularly to the semiconductor substrate.
申请公布号 KR100825806(B1) 申请公布日期 2008.04.29
申请号 KR20070017536 申请日期 2007.02.21
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, JONG EUN;YUK, KEUN CHAN
分类号 H01L27/146 主分类号 H01L27/146
代理机构 代理人
主权项
地址