发明名称 FAILURE DIAGNOSTIC METHOD AND ELECTRONIC DEVICE FAILURE DIAGNOSTIC SYSTEM
摘要 <P>PROBLEM TO BE SOLVED: To diagnose failure of an electronic device without changing the firmware of a diagnostic processor according to a configuration of an LSI of the electronic device or its change. <P>SOLUTION: At the occurrence of failure, the diagnostic processor 003 acquires failure log data 013 and a failure indication dictionary 014 from a chip set previously having the failure indication dictionary wherein a situation of a failure log and a failure part are associated, and analyzes the failure log data 013 according to the failure indication dictionary 014 to specify the failure part. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008310567(A) 申请公布日期 2008.12.25
申请号 JP20070157411 申请日期 2007.06.14
申请人 NEC CORP 发明人 KOISHI TAKAHIRO
分类号 G06F11/22 主分类号 G06F11/22
代理机构 代理人
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