发明名称 |
Phase-change memory units, methods of forming the phase-change memory units, phase-change memory devices having the phase-change memory units and methods of manufacturung the phase-change memory devices |
摘要 |
A phase-change memory unit includes a lower electrode on a substrate, a phase-change material layer pattern including germanium-antimony-tellurium (GST) and carbon on the lower electrode, a transition metal layer pattern on the phase-change material layer pattern, and an upper electrode on the first transition metal layer pattern. The phase-change memory unit may have good electrical characteristics.
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申请公布号 |
US2009057644(A1) |
申请公布日期 |
2009.03.05 |
申请号 |
US20080229500 |
申请日期 |
2008.08.22 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD |
发明人 |
SHIN HEE-JU;HA YONG-HO;PARK JEONG-HEE;KANG MYUNG-JIN;PARK DOO-HWAN |
分类号 |
H01L45/00 |
主分类号 |
H01L45/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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