发明名称 Phase-change memory units, methods of forming the phase-change memory units, phase-change memory devices having the phase-change memory units and methods of manufacturung the phase-change memory devices
摘要 A phase-change memory unit includes a lower electrode on a substrate, a phase-change material layer pattern including germanium-antimony-tellurium (GST) and carbon on the lower electrode, a transition metal layer pattern on the phase-change material layer pattern, and an upper electrode on the first transition metal layer pattern. The phase-change memory unit may have good electrical characteristics.
申请公布号 US2009057644(A1) 申请公布日期 2009.03.05
申请号 US20080229500 申请日期 2008.08.22
申请人 SAMSUNG ELECTRONICS CO., LTD 发明人 SHIN HEE-JU;HA YONG-HO;PARK JEONG-HEE;KANG MYUNG-JIN;PARK DOO-HWAN
分类号 H01L45/00 主分类号 H01L45/00
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