发明名称 Method of fabricating semiconductor device
摘要 The objective of the invention is to provide a method of fabricating semiconductor device using a laser crystallization method capable of preventing a grain boundary from being formed on the channel-forming region of a TFT and preventing the mobility of the TFT from extremely deteriorating, on-current from decreasing, or off-current from increasing due to a grain boundary and a semiconductor device fabricated by the fabrication method. Striped (banded) or rectangular concave and convex portions are formed. Then, a semiconductor film formed on an insulating film is irradiated with a laser beam diagonally to the longitudinal direction of concave and convex portions on the insulating film.
申请公布号 US7547593(B2) 申请公布日期 2009.06.16
申请号 US20070704214 申请日期 2007.02.09
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 MIYAIRI HIDEKAZU;ISOBE ATSUO;MORIWAKA TOMOAKI;SHIMOMURA AKIHISA
分类号 H01L21/84;C30B1/00;H01L21/20;H01L21/336;H01L21/768;H01L21/77;H01L29/04;H01L29/786 主分类号 H01L21/84
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