Device for thickness measurement of flat profiles

摘要

The invention relates to a device for continuous thickness measurement during rolling of flat profiles, having at least one gamma source with fan-shaped beam exit opening and a detector bar which is equipped with ionisation chambers and arranged transversely to the rolling direction. In such a known device, it is disadvantageous above all that it is impossible to eliminate the errors initiated by band drift. The invention provides that at least one source and one detector bar are arranged on a C-shaped measurement frame which is mounted capable of displacement transversely to the rolling direction and is connected to an oscillating drive device. It is achieved as a result that during each measurement cycle the strip edge serving as reference line is rescanned and this measured value is stored as initial value for the transverse profile measurement. <IMAGE>