发明名称 PLASMA PROCESSING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a plasma processing apparatus capable of preventing an abnormal discharge from occurring between a susceptor and a plasma. SOLUTION: The plasma processing apparatus comprises: a process chamber 2 in which a processing substrate G is accommodated; a susceptor 5 provided in the process chamber 2 on which the substrate G is mounted; an upper electrode 12 opposed to the susceptor 5 in the chamber 2; a process gas supply unit 19 for supplying a process gas into the chamber 2; an evacuation unit 21 for evacuating inside of the chamber 2; a high frequency power supply 26 for supplying a high frequency power to the susceptor 5 so that a plasma of the process gas is produced in a processing space 2a between the susceptor 5 and the upper electrode 12; and a shield 7 which surrounds a peripheral side wall of the substrate G so that a short-circuit path from the plasma to a side wall 5c of the substrate G on the susceptor is shielded.
申请公布号 JP2003100722(A) 申请公布日期 2003.04.04
申请号 JP20010297722 申请日期 2001.09.27
申请人 TOKYO ELECTRON LTD 发明人 SATOYOSHI TSUTOMU
分类号 H05H1/46;H01L21/302;H01L21/3065 主分类号 H05H1/46
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