发明名称 Forming high-K dielectric layers on smooth substrates
摘要 A buffer layer and a high-k metal oxide dielectric may be formed over a smooth silicon substrate. The substrate smoothness may reduce column growth of the high-k metal oxide gate dielectric. The surface of the substrate may be saturated with hydroxyl terminations prior to deposition.
申请公布号 US2008087985(A1) 申请公布日期 2008.04.17
申请号 US20070998236 申请日期 2007.11.29
申请人 BRASK JUSTIN K;KAVALIEROS JACK;DOCZY MARK L;METZ MATTHEW V;DATTA SUMAN;SHAH UDAY;DEWEY GILBERT;CHAU ROBERT S 发明人 BRASK JUSTIN K.;KAVALIEROS JACK;DOCZY MARK L.;METZ MATTHEW V.;DATTA SUMAN;SHAH UDAY;DEWEY GILBERT;CHAU ROBERT S.
分类号 H01L23/58 主分类号 H01L23/58
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