| 摘要 |
The invention relates to a carrier (111) and a microelectronic sensor device for making optical examinations with the help of the reflection of an input light beam (L1). The contact surface (112) of the carrier (111) at which the reflection takes place comprises an optical phase structure, e.g. a pattern of pits (115) and lands (114), from which an input light beam (L1) is reflected as a plurality of output light beams (L2) with phase differences. In a preferred embodiment, the phase differences are adjusted such that the output light beams destructively interfere in zero-th order. For a clean contact surface, a minimal, ideally zero signal will therefore be measured in the output light beam. If target substances (1) are present at the contact surface (112), e.g. bound to binding sites (116) on the lands (114), this balance is disturbed by frustrated total internal reflection, and a corresponding non-zero signal can be detected. |
