发明名称 SEAM-FREE TUNGSTEN PATTERN USING A TUNGSTEN REGROWING AND METHOD FOR MANUFACTURING THE SAME
摘要 PURPOSE: A phase change memory device and a manufacturing method thereof are provided to manufacture a device of uniform resistance density by forming seamless metal wiring on a tungsten layer of a semiconductor substrate through tungsten regrowth. CONSTITUTION: A first inter-layer dielectric(245) is formed on a semiconductor substrate(200). A contact hole is formed in the first inter-layer dielectric. A seamless tungsten layer is formed in the contact hole. A regrowth tungsten layer(283) containing oxygen is formed on the tungsten layer. A second inter-layer dielectric(250) surrounds the regrowth tungsten layer on the first inter-layer dielectric.
申请公布号 KR20100009029(A) 申请公布日期 2010.01.27
申请号 KR20080069700 申请日期 2008.07.17
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI, SUK HUN;HONG, CHANG KI;SON, YOON HO;JUNG, JU YOUNG
分类号 H01L21/28;H01L21/324 主分类号 H01L21/28
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