发明名称 OPTICAL ANALYSIS DEVICE
摘要 PROBLEM TO BE SOLVED: To attain a spectroscopic analysis device that can provide high wavelength resolution by use of a simple optical system.SOLUTION: An optical analysis device is provided that comprises: a halogen lamp 101 that is a light source; an irradiation system lens 104 that constitutes an irradiation optical system irradiating a measurement object with light from the halogen lamp 101;a mirror 106 that is in a position relation coaxial with the irradiation system lens 104, and is an optical member guiding detection light to an analysis unit 109 from between the halogen lamp 101 and the measurement object; and a spectrometer 109 that is the analysis unit analyzing a material constituting the measurement object on the basis of light received via the mirror 106. In a position of the mirror 106, the light heading for the measurement object from the halogen lamp 101 passes through a peripheral part of the optical axis of the irradiation system lens 104, and the light received by the spectrometer 109 passes through a centre portion of the optical axis of the irradiation system lens 104.SELECTED DRAWING: Figure 1
申请公布号 JP2016133473(A) 申请公布日期 2016.07.25
申请号 JP20150010131 申请日期 2015.01.22
申请人 TOPCON CORP 发明人 YUASA TAICHI
分类号 G01N21/01 主分类号 G01N21/01
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