发明名称 MONITORING SYSTEM FOR FLAW DETECTING DEVICE
摘要 PURPOSE:To monitor a position, length, visibility, etc. of a defective part mark, and to assure the reliability by collating a defect signal of a flaw detector with a mark discriminating signal by a mark sensor the defective part mark which has been affixed to an inspecting material by a marking device. CONSTITUTION:A flaw of an inspecting material 1 is detected by a flaw sensor 4, and a defect signal is inputted to a control part 7 and a monitor 12. The control part shifts the defect signal by a signal from a length measuring machine 6, the marking device is operated immediately before a defective part passes through the marking device 8, and a command is given so that a prescribed length is brought to marking. The monitor 12 shifts a defect signal from a flow detector 3, by a signal from the length measuring machine 6, and turns on a function of a mark sensor 11, when a defect mark has come to a position of the mark sensor. When the defect mark is detected during a distance in which the mark sensor is operating sensor, it is decided that the marking device 8 is operating normality.
申请公布号 JPS62249039(A) 申请公布日期 1987.10.30
申请号 JP19860091816 申请日期 1986.04.21
申请人 KOBE STEEL LTD 发明人 KIJIMA HIROYUKI
分类号 B21C51/00;G01N21/88;G01N21/89;G01N21/892 主分类号 B21C51/00
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