| 摘要 |
To avoid a strict, time-consuming, optical, mechanical and electrical test of a device which is fitted with EPROMs (erasable programmable read only memory), the procedure of removing, erasing and if necessary programming the EPROMs and plugging the memory board back into the device housing is replaced by erasing the EPROMs using ultra-violet radiation through a quartz window, which is fixed and/or fitted to an external wall of the housing, so that the erasing radiation falls on the erasure windows of the EPROM, which face outwards on the board. A self-test with the housing closed, and without external interference with the device, serves as the acceptance test.
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