发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device in which stress buffer performance is improved, Pb free solder can be adopted and further, a package for housing a semiconductor element can be downsized. SOLUTION: This device has a semiconductor chip 1, an insulating film formed on the surface of the semiconductor chip, a plurality of projection-like stress buffers 2 formed on the insulating film, projecting electrodes 3 covering at least tops of the stress buffers, and wires 4 for electrically connecting the projecting electrodes and the elementary electrodes of the semiconductor chip.
申请公布号 JP2003124393(A) 申请公布日期 2003.04.25
申请号 JP20010319440 申请日期 2001.10.17
申请人 HITACHI LTD 发明人 YAMAGUCHI YOSHIHIDE;TSUNODA SHIGEHARU;TENMYO HIROYUKI;HOZOJI HIROYUKI;ISADA NAOYA
分类号 H01L21/66;H01L21/56;H01L21/60;H01L23/12;H01L23/485 主分类号 H01L21/66
代理机构 代理人
主权项
地址