发明名称 CU-GA ALLOY SPUTTERING TARGET, AND METHOD FOR PRODUCING SAME
摘要 The present invention provides a sputtering target of a Cu—Ga sintered body in which the oxygen content is further reduced and the abnormal discharging can be suppressed, and a method for producing the same. The sputtering target according to the present invention is a sintered body having: a texture in which Na compound phases are dispersed in a matrix with a γ phase and a ζ phase of a Cu—Ga alloy; and a component composition made of: 20 atomic % to 30 atomic % of Ga; 0.05 atomic % to 10 atomic % of Na; and the Cu balance and inevitable impurities including elements other than Na in the Na compound, wherein an average grain size of the γ phase is 30 μm to 100 μm, and an average grain size of the Na compound phases is equal to or less than 8.5 μm.
申请公布号 US2016208376(A1) 申请公布日期 2016.07.21
申请号 US201414908346 申请日期 2014.07.25
申请人 MITSUBISHI MATERIALS CORPORATION 发明人 Yoshida Yuuki;Ishiyama Kouichi;Mori Satoru
分类号 C23C14/34;C22C9/00;C23C14/14;H01J37/34;B22F3/16;B22F5/00 主分类号 C23C14/34
代理机构 代理人
主权项 1. A Cu—Ga alloy sputtering target that is a sintered body having: a texture in which Na compound phases are dispersed in a matrix with a γ phase and a ζ phase of a Cu—Ga alloy; and a component composition made of: 20 atomic % to 30 atomic % of Ga; 0.05 atomic % to 10 atomic % of Na; and the Cu balance and inevitable impurities including elements other than Na in the Na compound, wherein an average grain size of the γ phase is 30 μm to 100 μm, and an average grain size of the Na compound phases is equal to or less than 8.5 μm.
地址 Tokyo JP