发明名称 FINFETS WITH WRAP-AROUND SILICIDE AND METHOD FORMING THE SAME
摘要 A device comprises isolation regions extending into a semiconductor substrate, with a substrate strip between opposite portions of the isolation regions having a first width. A source / drain region has a portion overlapping the substrate strip, wherein an upper portion of the source / drain region has a second width greater than the first width. The upper portion of the source / drain region has substantially vertical sidewalls. A source / drain silicide region has inner sidewalls contacting the vertical sidewalls of the source / drain region.
申请公布号 KR20160099447(A) 申请公布日期 2016.08.22
申请号 KR20150085680 申请日期 2015.06.17
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 CHING KUO CHENG;TSAI CHING WEI;LIU CHI WEN;WANG CHIH HAO;LEUNG YING KEUNG
分类号 H01L29/78;H01L29/66 主分类号 H01L29/78
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