发明名称 CANTILEVER ATTACHMENT FITTING AND SCANNING PROBE MICROSCOPE PROVIDED THEREWITH
摘要 The invention provides a cantilever attachment fitting that makes it easy to attach a cantilever to a cantilever holder. The cantilever attachment fitting has an attachment platform of which the upper surface is to have a cantilever placed on, a pressing member for pressing the cantilever against the upper surface of the attachment platform, and a lifting mechanism for moving the pressing member upward from the upper surface of the attachment platform. The cantilever attachment fitting is further provided with: a sliding platform having a sliding surface for sliding the cantilever toward the attachment platform; a base for fixing the cantilever holder in the horizontal direction so that the attachment platform is in a predetermined location relative to the sliding platform; and a pressing unit for pressing downward the cantilever holder fixed to the base.
申请公布号 US2016245844(A1) 申请公布日期 2016.08.25
申请号 US201415030914 申请日期 2014.03.26
申请人 SHIMADZU CORPORATION 发明人 KOKAWA Ryohei
分类号 G01Q70/02 主分类号 G01Q70/02
代理机构 代理人
主权项 1. A cantilever attachment fitting to be used for a cantilever holder, comprising an attachment platform of which the upper surface is to have a cantilever placed on, a pressing member for pressing the cantilever against the upper surface of the attachment platform, and a lifting mechanism for moving the pressing member upward from the upper surface of the attachment platform, characterized by further comprising: a sliding platform having a sliding surface along which said cantilever is to be slid by a person toward said attachment platform; a base for fixing said cantilever holder in the horizontal direction so that said attachment platform is in a predetermined location relative to said sliding platform; and a pressing unit for pressing downward said cantilever holder fixed to said base.
地址 Kyoto-city, Kyoto JP