Semiconductor integrated circuit and method of fabricating the same

摘要

To provide a semiconductor integrated circuit device in which an occupied area is suppressed from increasing and a high-performance test circuit is included, There is provided a semiconductor integrated circuit having a test circuit, by determining arrangement positions of cells forming a circuit to be tested and non-connected cells prepared to form a test circuit and then determining a connection relationship among the non-connected cells prepared to form the test circuit on the basis of the arrangement information to thereby form the test circuit.