发明名称 Semiconductor memory device and defect remedying method thereof
摘要 A semiconductor memory device formed on a semiconductor chip includes first memory arrays, a plurality of second memory arrays, a first voltage generator, and first bonding pads. The semiconductor chip is divided into first, second and third rectangle regions and the third rectangle region is arranged between the first rectangle region and the second rectangle region. The first memory arrays are formed in the first rectangle region. The second memory arrays are formed in the second rectangle region. The voltage generator and first bonding pads are arranged in the third rectangle region. The first bonding pads are arranged between the first rectangle region and the voltage generator and no bonding pads are arranged between the voltage generator and the second memory arrays.
申请公布号 US7345929(B2) 申请公布日期 2008.03.18
申请号 US20070714867 申请日期 2007.03.07
申请人 HITACHI, LTD.;HITACHI ULSI SYSTEMS CO., LTD. 发明人 KAJIGAYA KAZUHIKO;MIYAZAWA KAZUYUKI;TSUNOZAKI MANABU;OSHIMA KAZUYOSHI;YAMAZAKI TAKASHI;SAKAI YUJI;SAWADA JIRO;YAMAGUCHI YASUNORI;MATSUMOTO TETSUROU;UDO SHINJI;YOSHIOKA HIROSHI;SAITO HIROKAZU;TAKANO MITSUHIRO;MORINO MAKOTO;MIYATAKE SINICHI;MIYAMOTO EIJI;KASAMA YASUHIRO;ENDO AKIRA;HORI RYOICHI;ETOH JUN;HORIGUCHI MASASHI;IKENAGA SHINICHI;KUMATA ATSUSHI
分类号 G11C7/10;G11C5/00;G11C5/02;G11C5/06;G11C11/406;H01L23/485 主分类号 G11C7/10
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