发明名称 |
CONTACT PROBE AND ITS MANUFACTURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a contact probe and its manufacturing method, which forms simply a low melting-point layer for bonding the contact probe. SOLUTION: A base part 2 of the contact probe 1 is formed by laminating two or more conductive layers 11, and the low melting-point layer 12 comprising a conductive material having a lower melting point than the conductive layers 11 is formed along the end face 11A crossing to the extending direction of the conductive layers 11 relative to the laminated conductive layers 11. Such a low melting-point layer 12 is formed simply during a process for forming the contact probe 1 by laminating the conductive layers 11. COPYRIGHT: (C)2009,JPO&INPIT
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申请公布号 |
JP2008309534(A) |
申请公布日期 |
2008.12.25 |
申请号 |
JP20070155832 |
申请日期 |
2007.06.13 |
申请人 |
JAPAN ELECTRONIC MATERIALS CORP |
发明人 |
NAKATANI MASAHIRO;NAGATA KAZUSHI |
分类号 |
G01R1/067;G01R31/26;H01L21/66 |
主分类号 |
G01R1/067 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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