发明名称 FinFET semiconductor device with isolated fins made of alternative channel materials
摘要 One illustrative method disclosed herein includes, among other things, oxidizing a lower portion of an initial fin structure to thereby define an isolation region that vertically separates an upper portion of the initial fin structure from a semiconducting substrate, performing a recess etching process to remove a portion of the upper portion of the initial fin structure so as to define a recessed fin portion, forming a replacement fin on the recessed fin portion so as to define a final fin structure comprised of the replacement fin and the recessed fin portion, and forming a gate structure around at least a portion of the replacement fin.
申请公布号 US9425315(B2) 申请公布日期 2016.08.23
申请号 US201514811921 申请日期 2015.07.29
申请人 GLOBALFOUNDRIES Inc. 发明人 Jacob Ajey Poovannummoottil;Akarvardar Murat Kerem
分类号 H01L27/088;H01L29/78;H01L21/84;H01L29/66;H01L29/06;H01L29/165;H01L21/8238 主分类号 H01L27/088
代理机构 Amerson Law Firm, PLLC 代理人 Amerson Law Firm, PLLC
主权项 1. A FinFET device, comprising: a semiconducting substrate; a fin structure vertically separated from said substrate, said fin structure comprising an upper fin portion and a bottom fin portion, wherein said bottom fin portion is comprised of the substrate material and said upper fin portion is comprised of a semiconducting material that is different than said substrate material; an isolation region positioned below said bottom fin portion that vertically separates said fin structure from said semiconducting substrate; and a gate structure around at least a portion of said upper fin portion.
地址 Grand Cayman KY