发明名称 |
FinFET semiconductor device with isolated fins made of alternative channel materials |
摘要 |
One illustrative method disclosed herein includes, among other things, oxidizing a lower portion of an initial fin structure to thereby define an isolation region that vertically separates an upper portion of the initial fin structure from a semiconducting substrate, performing a recess etching process to remove a portion of the upper portion of the initial fin structure so as to define a recessed fin portion, forming a replacement fin on the recessed fin portion so as to define a final fin structure comprised of the replacement fin and the recessed fin portion, and forming a gate structure around at least a portion of the replacement fin. |
申请公布号 |
US9425315(B2) |
申请公布日期 |
2016.08.23 |
申请号 |
US201514811921 |
申请日期 |
2015.07.29 |
申请人 |
GLOBALFOUNDRIES Inc. |
发明人 |
Jacob Ajey Poovannummoottil;Akarvardar Murat Kerem |
分类号 |
H01L27/088;H01L29/78;H01L21/84;H01L29/66;H01L29/06;H01L29/165;H01L21/8238 |
主分类号 |
H01L27/088 |
代理机构 |
Amerson Law Firm, PLLC |
代理人 |
Amerson Law Firm, PLLC |
主权项 |
1. A FinFET device, comprising:
a semiconducting substrate; a fin structure vertically separated from said substrate, said fin structure comprising an upper fin portion and a bottom fin portion, wherein said bottom fin portion is comprised of the substrate material and said upper fin portion is comprised of a semiconducting material that is different than said substrate material; an isolation region positioned below said bottom fin portion that vertically separates said fin structure from said semiconducting substrate; and a gate structure around at least a portion of said upper fin portion. |
地址 |
Grand Cayman KY |