发明名称 MACHINING DEVICE FOR WAFER
摘要 <P>PROBLEM TO BE SOLVED: To provide a machining device for a wafer capable of machining it into a uniform thickness by preventing the lifting of the wafer under the machining. <P>SOLUTION: This machining device for the wafer is so formed that a suction pad 13 composed of a porous material is embedded in the upper surface part of a rotating table 1, and negative pressure passages 10 and 11 for applying a suction negative pressure to the whole lower surface of the wafer sucked by the suction pad. This device is provided with fluid feed means for jetting a pressurized fluid to the upper surface of the wafer. <P>COPYRIGHT: (C)2003,JPO
申请公布号 JP2003211353(A) 申请公布日期 2003.07.29
申请号 JP20020009521 申请日期 2002.01.18
申请人 NIPPEI TOYAMA CORP 发明人 OKUYAMA TETSUO;MURAI SHIRO
分类号 B24B37/30;B24B41/06;H01L21/304 主分类号 B24B37/30
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